Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cells
Descripción del Articulo
The authors would like to acknowledge the financial support of the Peruvian science foundation Cienciactiva in the framework of the DAAD-CONCYTEC joint project (2017-2019), the “Círculo de investigación” project and the Research Management Office (DGI) of the Pontificia Universidad Católica del Perú...
| Autores: | , , , , , , , , |
|---|---|
| Formato: | objeto de conferencia |
| Fecha de Publicación: | 2017 |
| Institución: | Consejo Nacional de Ciencia Tecnología e Innovación |
| Repositorio: | CONCYTEC-Institucional |
| Lenguaje: | inglés |
| OAI Identifier: | oai:repositorio.concytec.gob.pe:20.500.12390/753 |
| Enlace del recurso: | https://hdl.handle.net/20.500.12390/753 https://doi.org/10.1557/adv.2017.478 |
| Nivel de acceso: | acceso abierto |
| Materia: | Ytterbium compounds Aluminum compounds Annealing Cobalt compounds Energy dispersive X ray analysis Infrared devices Luminescence Nitrides Photoelectrochemical cells Photovoltaic cells Rare earth elements Semiconductor doping Sputtering Thin films X ray diffraction analysis Aluminum oxynitride Aluminum oxynitride thin films Annealing temperatures Doping concentration Near-infrared emissions Photoluminescence measurements Radio frequency magnetron sputtering Silicon substrates https://purl.org/pe-repo/ocde/ford#2.07.00 |
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| dc.title.none.fl_str_mv |
Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cells |
| title |
Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cells |
| spellingShingle |
Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cells Tucto K. Ytterbium compounds Aluminum compounds Annealing Cobalt compounds Energy dispersive X ray analysis Energy dispersive X ray analysis Infrared devices Infrared devices Luminescence Nitrides Photoelectrochemical cells Photovoltaic cells Rare earth elements Semiconductor doping Sputtering Thin films X ray diffraction analysis X ray diffraction analysis Aluminum oxynitride Aluminum oxynitride Aluminum oxynitride thin films Annealing temperatures Doping concentration Near-infrared emissions Photoluminescence measurements Radio frequency magnetron sputtering Silicon substrates https://purl.org/pe-repo/ocde/ford#2.07.00 |
| title_short |
Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cells |
| title_full |
Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cells |
| title_fullStr |
Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cells |
| title_full_unstemmed |
Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cells |
| title_sort |
Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cells |
| author |
Tucto K. |
| author_facet |
Tucto K. Flores L. Guerra J. Töfflinger J. Dulanto J. Grieseler R. Osvet A. Batentschuk M. Weingärtner R. |
| author_role |
author |
| author2 |
Flores L. Guerra J. Töfflinger J. Dulanto J. Grieseler R. Osvet A. Batentschuk M. Weingärtner R. |
| author2_role |
author author author author author author author author |
| dc.contributor.author.fl_str_mv |
Tucto K. Flores L. Guerra J. Töfflinger J. Dulanto J. Grieseler R. Osvet A. Batentschuk M. Weingärtner R. |
| dc.subject.none.fl_str_mv |
Ytterbium compounds |
| topic |
Ytterbium compounds Aluminum compounds Annealing Cobalt compounds Energy dispersive X ray analysis Energy dispersive X ray analysis Infrared devices Infrared devices Luminescence Nitrides Photoelectrochemical cells Photovoltaic cells Rare earth elements Semiconductor doping Sputtering Thin films X ray diffraction analysis X ray diffraction analysis Aluminum oxynitride Aluminum oxynitride Aluminum oxynitride thin films Annealing temperatures Doping concentration Near-infrared emissions Photoluminescence measurements Radio frequency magnetron sputtering Silicon substrates https://purl.org/pe-repo/ocde/ford#2.07.00 |
| dc.subject.es_PE.fl_str_mv |
Aluminum compounds Annealing Cobalt compounds Energy dispersive X ray analysis Energy dispersive X ray analysis Infrared devices Infrared devices Luminescence Nitrides Photoelectrochemical cells Photovoltaic cells Rare earth elements Semiconductor doping Sputtering Thin films X ray diffraction analysis X ray diffraction analysis Aluminum oxynitride Aluminum oxynitride Aluminum oxynitride thin films Annealing temperatures Doping concentration Near-infrared emissions Photoluminescence measurements Radio frequency magnetron sputtering Silicon substrates |
| dc.subject.ocde.none.fl_str_mv |
https://purl.org/pe-repo/ocde/ford#2.07.00 |
| description |
The authors would like to acknowledge the financial support of the Peruvian science foundation Cienciactiva in the framework of the DAAD-CONCYTEC joint project (2017-2019), the “Círculo de investigación” project and the Research Management Office (DGI) of the Pontificia Universidad Católica del Perú (PUCP). The research activity was performed in the framework of the doctoral scholarship of K. Tucto and L. Flores from CONCYTEC under the contract numbers 012-2013-FONDECYT and 000236-2015-FONDECYT-DE, respectively. The authors are also grateful to the Center of Microcharacterization (CAM) of the PUCP for the EDX and PL measurements. |
| publishDate |
2017 |
| dc.date.accessioned.none.fl_str_mv |
2024-05-30T23:13:38Z |
| dc.date.available.none.fl_str_mv |
2024-05-30T23:13:38Z |
| dc.date.issued.fl_str_mv |
2017 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
| format |
conferenceObject |
| dc.identifier.uri.none.fl_str_mv |
https://hdl.handle.net/20.500.12390/753 |
| dc.identifier.doi.none.fl_str_mv |
https://doi.org/10.1557/adv.2017.478 |
| dc.identifier.scopus.none.fl_str_mv |
2-s2.0-85047181476 |
| url |
https://hdl.handle.net/20.500.12390/753 https://doi.org/10.1557/adv.2017.478 |
| identifier_str_mv |
2-s2.0-85047181476 |
| dc.language.iso.none.fl_str_mv |
eng |
| language |
eng |
| dc.relation.ispartof.none.fl_str_mv |
MRS Advances |
| dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess |
| eu_rights_str_mv |
openAccess |
| dc.publisher.none.fl_str_mv |
Materials Research Society |
| publisher.none.fl_str_mv |
Materials Research Society |
| dc.source.none.fl_str_mv |
reponame:CONCYTEC-Institucional instname:Consejo Nacional de Ciencia Tecnología e Innovación instacron:CONCYTEC |
| instname_str |
Consejo Nacional de Ciencia Tecnología e Innovación |
| instacron_str |
CONCYTEC |
| institution |
CONCYTEC |
| reponame_str |
CONCYTEC-Institucional |
| collection |
CONCYTEC-Institucional |
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Repositorio Institucional CONCYTEC |
| repository.mail.fl_str_mv |
repositorio@concytec.gob.pe |
| _version_ |
1839175459627073536 |
| spelling |
Publicationrp00713400rp01552500rp00710500rp00712500rp01922600rp01106500rp01107500rp01103500rp00714500Tucto K.Flores L.Guerra J.Töfflinger J.Dulanto J.Grieseler R.Osvet A.Batentschuk M.Weingärtner R.2024-05-30T23:13:38Z2024-05-30T23:13:38Z2017https://hdl.handle.net/20.500.12390/753https://doi.org/10.1557/adv.2017.4782-s2.0-85047181476The authors would like to acknowledge the financial support of the Peruvian science foundation Cienciactiva in the framework of the DAAD-CONCYTEC joint project (2017-2019), the “Círculo de investigación” project and the Research Management Office (DGI) of the Pontificia Universidad Católica del Perú (PUCP). The research activity was performed in the framework of the doctoral scholarship of K. Tucto and L. Flores from CONCYTEC under the contract numbers 012-2013-FONDECYT and 000236-2015-FONDECYT-DE, respectively. The authors are also grateful to the Center of Microcharacterization (CAM) of the PUCP for the EDX and PL measurements.Terbium and ytterbium co-doped aluminum oxynitride thin films were grown onto silicon substrates using radiofrequency magnetron sputtering. Aluminum oxynitride samples doped with 4.6 at. % of Yb3+ and co-doped with 0.4 at. % of Tb3+ were obtained. The prepared samples were annealed from 150ºC to 850ºC in steps of 100ºC. By using energy dispersive X-ray analysis we measured the sample composition and the doping concentration. The emission intensities at different annealing temperatures were characterized using photoluminescence measurements upon excitation at 325 nm. The 5D4 → 7F5 main transition of Tb3+ and the characteristic near infrared emission at 980 nm of Yb3+ were recorded. In order to study the luminescence behavior of the samples in terms of a down conversion process, we have plotted the integrated areas of the main transition peaks versus the annealing temperature.Consejo Nacional de Ciencia, Tecnología e Innovación Tecnológica - ConcytecengMaterials Research SocietyMRS Advancesinfo:eu-repo/semantics/openAccessYtterbium compoundsAluminum compounds-1Annealing-1Cobalt compounds-1Energy dispersive X ray analysis-1Energy dispersive X ray analysis-1Infrared devices-1Infrared devices-1Luminescence-1Nitrides-1Photoelectrochemical cells-1Photovoltaic cells-1Rare earth elements-1Semiconductor doping-1Sputtering-1Thin films-1X ray diffraction analysis-1X ray diffraction analysis-1Aluminum oxynitride-1Aluminum oxynitride-1Aluminum oxynitride thin films-1Annealing temperatures-1Doping concentration-1Near-infrared emissions-1Photoluminescence measurements-1Radio frequency magnetron sputtering-1Silicon substrates-1https://purl.org/pe-repo/ocde/ford#2.07.00-1Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cellsinfo:eu-repo/semantics/conferenceObjectreponame:CONCYTEC-Institucionalinstname:Consejo Nacional de Ciencia Tecnología e Innovacióninstacron:CONCYTEC#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#20.500.12390/753oai:repositorio.concytec.gob.pe:20.500.12390/7532024-05-30 15:22:50.111http://purl.org/coar/access_right/c_14cbinfo:eu-repo/semantics/closedAccessmetadata only accesshttps://repositorio.concytec.gob.peRepositorio Institucional CONCYTECrepositorio@concytec.gob.pe#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#<Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="22f4657d-c576-471a-9dfa-ec985c17ed19"> <Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type> <Language>eng</Language> <Title>Production and Characterization of Tb3+/Yb3+ Co-Activated AlON Thin Films for Down Conversion Applications in Photovoltaic Cells</Title> <PublishedIn> <Publication> <Title>MRS Advances</Title> </Publication> </PublishedIn> <PublicationDate>2017</PublicationDate> <DOI>https://doi.org/10.1557/adv.2017.478</DOI> <SCP-Number>2-s2.0-85047181476</SCP-Number> <Authors> <Author> <DisplayName>Tucto K.</DisplayName> <Person id="rp00713" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Flores L.</DisplayName> <Person id="rp01552" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Guerra J.</DisplayName> <Person id="rp00710" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Töfflinger J.</DisplayName> <Person id="rp00712" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Dulanto J.</DisplayName> <Person id="rp01922" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Grieseler R.</DisplayName> <Person id="rp01106" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Osvet A.</DisplayName> <Person id="rp01107" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Batentschuk M.</DisplayName> <Person id="rp01103" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Weingärtner R.</DisplayName> <Person id="rp00714" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> </Authors> <Editors> </Editors> <Publishers> <Publisher> <DisplayName>Materials Research Society</DisplayName> <OrgUnit /> </Publisher> </Publishers> <Keyword>Ytterbium compounds</Keyword> <Keyword>Aluminum compounds</Keyword> <Keyword>Annealing</Keyword> <Keyword>Cobalt compounds</Keyword> <Keyword>Energy dispersive X ray analysis</Keyword> <Keyword>Energy dispersive X ray analysis</Keyword> <Keyword>Infrared devices</Keyword> <Keyword>Infrared devices</Keyword> <Keyword>Luminescence</Keyword> <Keyword>Nitrides</Keyword> <Keyword>Photoelectrochemical cells</Keyword> <Keyword>Photovoltaic cells</Keyword> <Keyword>Rare earth elements</Keyword> <Keyword>Semiconductor doping</Keyword> <Keyword>Sputtering</Keyword> <Keyword>Thin films</Keyword> <Keyword>X ray diffraction analysis</Keyword> <Keyword>X ray diffraction analysis</Keyword> <Keyword>Aluminum oxynitride</Keyword> <Keyword>Aluminum oxynitride</Keyword> <Keyword>Aluminum oxynitride thin films</Keyword> <Keyword>Annealing temperatures</Keyword> <Keyword>Doping concentration</Keyword> <Keyword>Near-infrared emissions</Keyword> <Keyword>Photoluminescence measurements</Keyword> <Keyword>Radio frequency magnetron sputtering</Keyword> <Keyword>Silicon substrates</Keyword> <Abstract>Terbium and ytterbium co-doped aluminum oxynitride thin films were grown onto silicon substrates using radiofrequency magnetron sputtering. Aluminum oxynitride samples doped with 4.6 at. % of Yb3+ and co-doped with 0.4 at. % of Tb3+ were obtained. The prepared samples were annealed from 150ºC to 850ºC in steps of 100ºC. By using energy dispersive X-ray analysis we measured the sample composition and the doping concentration. The emission intensities at different annealing temperatures were characterized using photoluminescence measurements upon excitation at 325 nm. The 5D4 → 7F5 main transition of Tb3+ and the characteristic near infrared emission at 980 nm of Yb3+ were recorded. In order to study the luminescence behavior of the samples in terms of a down conversion process, we have plotted the integrated areas of the main transition peaks versus the annealing temperature.</Abstract> <Access xmlns="http://purl.org/coar/access_right" > </Access> </Publication> -1 |
| score |
13.448654 |
Nota importante:
La información contenida en este registro es de entera responsabilidad de la institución que gestiona el repositorio institucional donde esta contenido este documento o set de datos. El CONCYTEC no se hace responsable por los contenidos (publicaciones y/o datos) accesibles a través del Repositorio Nacional Digital de Ciencia, Tecnología e Innovación de Acceso Abierto (ALICIA).
La información contenida en este registro es de entera responsabilidad de la institución que gestiona el repositorio institucional donde esta contenido este documento o set de datos. El CONCYTEC no se hace responsable por los contenidos (publicaciones y/o datos) accesibles a través del Repositorio Nacional Digital de Ciencia, Tecnología e Innovación de Acceso Abierto (ALICIA).
