Luminescence properties of Yb3+-Tb3+ co-doped amorphous silicon oxycarbide thin films

• Autores: Flores L.F., Tucto K.Y., Guerra J.A., Töfflinger J.A., Serquen E.S., Osvet A., Batentschuk M., Winnacker A., Grieseler R., Weingärtner R.
• Formato: artículo
• Fecha de Publicación: 2019
• Institución: Consejo Nacional de Ciencia Tecnología e Innovación
• Repositorio: CONCYTEC-Institucional
• Lenguaje: inglés
• OAI Identifier: oai:repositorio.concytec.gob.pe:20.500.12390/683
• Enlace del recurso: https://hdl.handle.net/20.500.12390/683; https://doi.org/10.1016/j.optmat.2019.04.003
• Nivel de acceso: acceso abierto
• Materia: Ytterbium alloys; Amorphous films; Annealing; Binary alloys; Chemical activation; Energy dispersive spectroscopy; Energy transfer; Fourier transform infrared spectroscopy; Luminescence of inorganic solids; Photoluminescence; Rare earths; Silicon carbide; Silicon compounds; Terbium; Terbium alloys; Thin films; Ytterbium; Amorphous silicon oxycarbide; Energy dispersive X ray spectroscopy; Photoluminescence decay curves; Photoluminescence excitation spectrum; Photoluminescence intensities; Photoluminescence lifetime; rf-Magnetron sputtering; Silicon oxycarbides; Amorphous silicon; https://purl.org/pe-repo/ocde/ford#1.03.00

This work was supported by the Peruvian science foundation CIENCIACTIVA of CONCYTEC and DAAD-CONCYTEC project (2017–2019). The Research Management Office (DGI) of the the Pontificia Universidad Católica del Perú (PUCP) project 492-2017. The research activity was performed in the framework of the doctoral scholarship of L. F. Flores under the contract number 236-2015-FONDECYT. The authors are also thankful to the Center of Materials Characterization (CAM) and the Institute of Corrosion and Protection (ICP) of the PUCP for the EDX, PL and FTIR measurements.