Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork
Descripción del Articulo
We wish to thank Laurent Pham-Van (CEA/IRAMIS/SPEC/LEPO) for fruitful discussions on the tip etching process and Sylvain Foucquart (CEA/IRAMIS/NIMBE/LIONS) for his technical assistance. José Antonio Morán Meza would also like to acknowledge financial support from the Peru’s National Council of Scien...
| Autores: | , , , , , , |
|---|---|
| Formato: | artículo |
| Fecha de Publicación: | 2015 |
| Institución: | Consejo Nacional de Ciencia Tecnología e Innovación |
| Repositorio: | CONCYTEC-Institucional |
| Lenguaje: | inglés |
| OAI Identifier: | oai:repositorio.concytec.gob.pe:20.500.12390/662 |
| Enlace del recurso: | https://hdl.handle.net/20.500.12390/662 https://doi.org/10.1016/j.cap.2015.05.015 |
| Nivel de acceso: | acceso abierto |
| Materia: | Tuning Atomic force microscopy Frequency modulation Platinum Quartz Scanning tunneling microscopy Silicon carbide AFM Electrochemical process Epitaxial graphene Field emission measurements Fowler-Nordheim plots Frequency modulated STM Electrochemical etching https://purl.org/pe-repo/ocde/ford#1.04.00 |
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CONC |
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CONCYTEC-Institucional |
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4689 |
| dc.title.none.fl_str_mv |
Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork |
| title |
Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork |
| spellingShingle |
Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork Meza J.A.M. Tuning Atomic force microscopy Frequency modulation Platinum Quartz Scanning tunneling microscopy Silicon carbide AFM Electrochemical process Epitaxial graphene Field emission measurements Field emission measurements Fowler-Nordheim plots Frequency modulated Frequency modulated STM Electrochemical etching https://purl.org/pe-repo/ocde/ford#1.04.00 |
| title_short |
Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork |
| title_full |
Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork |
| title_fullStr |
Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork |
| title_full_unstemmed |
Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork |
| title_sort |
Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork |
| author |
Meza J.A.M. |
| author_facet |
Meza J.A.M. Polesel-Maris J. Lubin C. Thoyer F. Makky A. Ouerghi A. Cousty J. |
| author_role |
author |
| author2 |
Polesel-Maris J. Lubin C. Thoyer F. Makky A. Ouerghi A. Cousty J. |
| author2_role |
author author author author author author |
| dc.contributor.author.fl_str_mv |
Meza J.A.M. Polesel-Maris J. Lubin C. Thoyer F. Makky A. Ouerghi A. Cousty J. |
| dc.subject.none.fl_str_mv |
Tuning |
| topic |
Tuning Atomic force microscopy Frequency modulation Platinum Quartz Scanning tunneling microscopy Silicon carbide AFM Electrochemical process Epitaxial graphene Field emission measurements Field emission measurements Fowler-Nordheim plots Frequency modulated Frequency modulated STM Electrochemical etching https://purl.org/pe-repo/ocde/ford#1.04.00 |
| dc.subject.es_PE.fl_str_mv |
Atomic force microscopy Frequency modulation Platinum Quartz Scanning tunneling microscopy Silicon carbide AFM Electrochemical process Epitaxial graphene Field emission measurements Field emission measurements Fowler-Nordheim plots Frequency modulated Frequency modulated STM Electrochemical etching |
| dc.subject.ocde.none.fl_str_mv |
https://purl.org/pe-repo/ocde/ford#1.04.00 |
| description |
We wish to thank Laurent Pham-Van (CEA/IRAMIS/SPEC/LEPO) for fruitful discussions on the tip etching process and Sylvain Foucquart (CEA/IRAMIS/NIMBE/LIONS) for his technical assistance. José Antonio Morán Meza would also like to acknowledge financial support from the Peru’s National Council of Science and Technology (Concytec), the Réseau Thématique de Recherche Avancée (RTRA-Triangle de la Physique), and the CEA/Direction des Relations Internationales (DRI). |
| publishDate |
2015 |
| dc.date.accessioned.none.fl_str_mv |
2024-05-30T23:13:38Z |
| dc.date.available.none.fl_str_mv |
2024-05-30T23:13:38Z |
| dc.date.issued.fl_str_mv |
2015 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article |
| format |
article |
| dc.identifier.uri.none.fl_str_mv |
https://hdl.handle.net/20.500.12390/662 |
| dc.identifier.doi.none.fl_str_mv |
https://doi.org/10.1016/j.cap.2015.05.015 |
| dc.identifier.scopus.none.fl_str_mv |
2-s2.0-84933516281 |
| url |
https://hdl.handle.net/20.500.12390/662 https://doi.org/10.1016/j.cap.2015.05.015 |
| identifier_str_mv |
2-s2.0-84933516281 |
| dc.language.iso.none.fl_str_mv |
eng |
| language |
eng |
| dc.relation.ispartof.none.fl_str_mv |
Current Applied Physics |
| dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess |
| eu_rights_str_mv |
openAccess |
| dc.publisher.none.fl_str_mv |
Elsevier |
| publisher.none.fl_str_mv |
Elsevier |
| dc.source.none.fl_str_mv |
reponame:CONCYTEC-Institucional instname:Consejo Nacional de Ciencia Tecnología e Innovación instacron:CONCYTEC |
| instname_str |
Consejo Nacional de Ciencia Tecnología e Innovación |
| instacron_str |
CONCYTEC |
| institution |
CONCYTEC |
| reponame_str |
CONCYTEC-Institucional |
| collection |
CONCYTEC-Institucional |
| repository.name.fl_str_mv |
Repositorio Institucional CONCYTEC |
| repository.mail.fl_str_mv |
repositorio@concytec.gob.pe |
| _version_ |
1839175428628021248 |
| spelling |
Publicationrp01486600rp01488600rp01463500rp01460500rp01489600rp01487600rp00651500Meza J.A.M.Polesel-Maris J.Lubin C.Thoyer F.Makky A.Ouerghi A.Cousty J.2024-05-30T23:13:38Z2024-05-30T23:13:38Z2015https://hdl.handle.net/20.500.12390/662https://doi.org/10.1016/j.cap.2015.05.0152-s2.0-84933516281We wish to thank Laurent Pham-Van (CEA/IRAMIS/SPEC/LEPO) for fruitful discussions on the tip etching process and Sylvain Foucquart (CEA/IRAMIS/NIMBE/LIONS) for his technical assistance. José Antonio Morán Meza would also like to acknowledge financial support from the Peru’s National Council of Science and Technology (Concytec), the Réseau Thématique de Recherche Avancée (RTRA-Triangle de la Physique), and the CEA/Direction des Relations Internationales (DRI).Sharp Pt/Ir tips have been reproducibly etched by an electrochemical process using an inverse geometry of an electrochemical cell and a dedicated electronic device which allows us to control the applied voltages waveform and the intensity of the etching current. Conductive tips with a radius smaller than 10 nm were routinely produced as shown by field emission measurements through Fowler–Nordheim plots.Consejo Nacional de Ciencia, Tecnología e Innovación Tecnológica - ConcytecengElsevierCurrent Applied Physicsinfo:eu-repo/semantics/openAccessTuningAtomic force microscopy-1Frequency modulation-1Platinum-1Quartz-1Scanning tunneling microscopy-1Silicon carbide-1AFM-1Electrochemical process-1Epitaxial graphene-1Field emission measurements-1Field emission measurements-1Fowler-Nordheim plots-1Frequency modulated-1Frequency modulated-1STM-1Electrochemical etching-1https://purl.org/pe-repo/ocde/ford#1.04.00-1Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning forkinfo:eu-repo/semantics/articlereponame:CONCYTEC-Institucionalinstname:Consejo Nacional de Ciencia Tecnología e Innovacióninstacron:CONCYTEC#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#20.500.12390/662oai:repositorio.concytec.gob.pe:20.500.12390/6622024-05-30 15:35:55.583http://purl.org/coar/access_right/c_14cbinfo:eu-repo/semantics/closedAccessmetadata only accesshttps://repositorio.concytec.gob.peRepositorio Institucional CONCYTECrepositorio@concytec.gob.pe#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#<Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="13dc4674-bf8e-44e8-827c-cb3f0c63ed57"> <Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type> <Language>eng</Language> <Title>Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork</Title> <PublishedIn> <Publication> <Title>Current Applied Physics</Title> </Publication> </PublishedIn> <PublicationDate>2015</PublicationDate> <DOI>https://doi.org/10.1016/j.cap.2015.05.015</DOI> <SCP-Number>2-s2.0-84933516281</SCP-Number> <Authors> <Author> <DisplayName>Meza J.A.M.</DisplayName> <Person id="rp01486" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Polesel-Maris J.</DisplayName> <Person id="rp01488" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Lubin C.</DisplayName> <Person id="rp01463" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Thoyer F.</DisplayName> <Person id="rp01460" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Makky A.</DisplayName> <Person id="rp01489" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Ouerghi A.</DisplayName> <Person id="rp01487" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Cousty J.</DisplayName> <Person id="rp00651" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> </Authors> <Editors> </Editors> <Publishers> <Publisher> <DisplayName>Elsevier</DisplayName> <OrgUnit /> </Publisher> </Publishers> <Keyword>Tuning</Keyword> <Keyword>Atomic force microscopy</Keyword> <Keyword>Frequency modulation</Keyword> <Keyword>Platinum</Keyword> <Keyword>Quartz</Keyword> <Keyword>Scanning tunneling microscopy</Keyword> <Keyword>Silicon carbide</Keyword> <Keyword>AFM</Keyword> <Keyword>Electrochemical process</Keyword> <Keyword>Epitaxial graphene</Keyword> <Keyword>Field emission measurements</Keyword> <Keyword>Field emission measurements</Keyword> <Keyword>Fowler-Nordheim plots</Keyword> <Keyword>Frequency modulated</Keyword> <Keyword>Frequency modulated</Keyword> <Keyword>STM</Keyword> <Keyword>Electrochemical etching</Keyword> <Abstract>Sharp Pt/Ir tips have been reproducibly etched by an electrochemical process using an inverse geometry of an electrochemical cell and a dedicated electronic device which allows us to control the applied voltages waveform and the intensity of the etching current. Conductive tips with a radius smaller than 10 nm were routinely produced as shown by field emission measurements through Fowler–Nordheim plots.</Abstract> <Access xmlns="http://purl.org/coar/access_right" > </Access> </Publication> -1 |
| score |
13.210282 |
Nota importante:
La información contenida en este registro es de entera responsabilidad de la institución que gestiona el repositorio institucional donde esta contenido este documento o set de datos. El CONCYTEC no se hace responsable por los contenidos (publicaciones y/o datos) accesibles a través del Repositorio Nacional Digital de Ciencia, Tecnología e Innovación de Acceso Abierto (ALICIA).
La información contenida en este registro es de entera responsabilidad de la institución que gestiona el repositorio institucional donde esta contenido este documento o set de datos. El CONCYTEC no se hace responsable por los contenidos (publicaciones y/o datos) accesibles a través del Repositorio Nacional Digital de Ciencia, Tecnología e Innovación de Acceso Abierto (ALICIA).
