Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork

• Autores: Meza J.A.M., Polesel-Maris J., Lubin C., Thoyer F., Makky A., Ouerghi A., Cousty J.
• Formato: artículo
• Fecha de Publicación: 2015
• Institución: Consejo Nacional de Ciencia Tecnología e Innovación
• Repositorio: CONCYTEC-Institucional
• Lenguaje: inglés
• OAI Identifier: oai:repositorio.concytec.gob.pe:20.500.12390/662
• Enlace del recurso: https://hdl.handle.net/20.500.12390/662; https://doi.org/10.1016/j.cap.2015.05.015
• Nivel de acceso: acceso abierto
• Materia: Tuning; Atomic force microscopy; Frequency modulation; Platinum; Quartz; Scanning tunneling microscopy; Silicon carbide; AFM; Electrochemical process; Epitaxial graphene; Field emission measurements; Fowler-Nordheim plots; Frequency modulated; STM; Electrochemical etching; https://purl.org/pe-repo/ocde/ford#1.04.00

We wish to thank Laurent Pham-Van (CEA/IRAMIS/SPEC/LEPO) for fruitful discussions on the tip etching process and Sylvain Foucquart (CEA/IRAMIS/NIMBE/LIONS) for his technical assistance. José Antonio Morán Meza would also like to acknowledge financial support from the Peru’s National Council of Science and Technology (Concytec), the Réseau Thématique de Recherche Avancée (RTRA-Triangle de la Physique), and the CEA/Direction des Relations Internationales (DRI).