Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface
Descripción del Articulo
The fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or...
Autores: | , , , , , , |
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Formato: | artículo |
Fecha de Publicación: | 2015 |
Institución: | Consejo Nacional de Ciencia Tecnología e Innovación |
Repositorio: | CONCYTEC-Institucional |
Lenguaje: | inglés |
OAI Identifier: | oai:repositorio.concytec.gob.pe:20.500.12390/657 |
Enlace del recurso: | https://hdl.handle.net/20.500.12390/657 https://doi.org/10.1016/j.carbon.2015.01.050 |
Nivel de acceso: | acceso abierto |
Materia: | Thermoelectric equipment Atomic force microscopy Carbon Carbon fibers Frequency modulation Graphene Silicon carbide Dynamic scanning Electronic device Epitaxial graphene Force gradients Fowler-Nordheim plots https://purl.org/pe-repo/ocde/ford#2.10.00 |
Sumario: | The fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or NaOH solution, using different electronic devices. CF tips with an apex radius ∼10 nm, as deduced from the measured slopes of the Fowler–Nordheim plots (kR < 70 nm for k ∼ 6), were routinely obtained with a homemade electronic device that controls the intensity of the etching current. Then, these conductive CF tips were also characterized by imaging the 6H-SiC(0 0 0 1) surface covered by an epitaxial graphene layer in ultra-high vacuum (UHV). The lattice of the R30° reconstruction was regularly imaged by STM working either in non-oscillating mode or in dynamic mode, which also maps the variations of the force gradient. From these measurements with a constant mean-tunneling-current of 20 pA, it was found that the STM tip suffered variations of the tip/surface force gradient in between 8.25 and 16.50 N/m when it scanned the epitaxial graphene layer on the reconstructed 6H-SiC(0 0 0 1) surface. |
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La información contenida en este registro es de entera responsabilidad de la institución que gestiona el repositorio institucional donde esta contenido este documento o set de datos. El CONCYTEC no se hace responsable por los contenidos (publicaciones y/o datos) accesibles a través del Repositorio Nacional Digital de Ciencia, Tecnología e Innovación de Acceso Abierto (ALICIA).
La información contenida en este registro es de entera responsabilidad de la institución que gestiona el repositorio institucional donde esta contenido este documento o set de datos. El CONCYTEC no se hace responsable por los contenidos (publicaciones y/o datos) accesibles a través del Repositorio Nacional Digital de Ciencia, Tecnología e Innovación de Acceso Abierto (ALICIA).