Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface
Descripción del Articulo
The fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or...
Autores: | , , , , , , |
---|---|
Formato: | artículo |
Fecha de Publicación: | 2015 |
Institución: | Consejo Nacional de Ciencia Tecnología e Innovación |
Repositorio: | CONCYTEC-Institucional |
Lenguaje: | inglés |
OAI Identifier: | oai:repositorio.concytec.gob.pe:20.500.12390/657 |
Enlace del recurso: | https://hdl.handle.net/20.500.12390/657 https://doi.org/10.1016/j.carbon.2015.01.050 |
Nivel de acceso: | acceso abierto |
Materia: | Thermoelectric equipment Atomic force microscopy Carbon Carbon fibers Frequency modulation Graphene Silicon carbide Dynamic scanning Electronic device Epitaxial graphene Force gradients Fowler-Nordheim plots https://purl.org/pe-repo/ocde/ford#2.10.00 |
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CONC |
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CONCYTEC-Institucional |
repository_id_str |
4689 |
dc.title.none.fl_str_mv |
Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface |
title |
Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface |
spellingShingle |
Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface Morán Meza J.A. Thermoelectric equipment Atomic force microscopy Carbon Carbon fibers Frequency modulation Graphene Silicon carbide Dynamic scanning Electronic device Epitaxial graphene Force gradients Fowler-Nordheim plots https://purl.org/pe-repo/ocde/ford#2.10.00 |
title_short |
Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface |
title_full |
Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface |
title_fullStr |
Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface |
title_full_unstemmed |
Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface |
title_sort |
Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface |
author |
Morán Meza J.A. |
author_facet |
Morán Meza J.A. Lubin C. Thoyer F. Villegas Rosales K.A. Gutarra Espinoza A.A. Martin F. Cousty J. |
author_role |
author |
author2 |
Lubin C. Thoyer F. Villegas Rosales K.A. Gutarra Espinoza A.A. Martin F. Cousty J. |
author2_role |
author author author author author author |
dc.contributor.author.fl_str_mv |
Morán Meza J.A. Lubin C. Thoyer F. Villegas Rosales K.A. Gutarra Espinoza A.A. Martin F. Cousty J. |
dc.subject.none.fl_str_mv |
Thermoelectric equipment |
topic |
Thermoelectric equipment Atomic force microscopy Carbon Carbon fibers Frequency modulation Graphene Silicon carbide Dynamic scanning Electronic device Epitaxial graphene Force gradients Fowler-Nordheim plots https://purl.org/pe-repo/ocde/ford#2.10.00 |
dc.subject.es_PE.fl_str_mv |
Atomic force microscopy Carbon Carbon fibers Frequency modulation Graphene Silicon carbide Dynamic scanning Electronic device Epitaxial graphene Force gradients Fowler-Nordheim plots |
dc.subject.ocde.none.fl_str_mv |
https://purl.org/pe-repo/ocde/ford#2.10.00 |
description |
The fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or NaOH solution, using different electronic devices. CF tips with an apex radius ∼10 nm, as deduced from the measured slopes of the Fowler–Nordheim plots (kR < 70 nm for k ∼ 6), were routinely obtained with a homemade electronic device that controls the intensity of the etching current. Then, these conductive CF tips were also characterized by imaging the 6H-SiC(0 0 0 1) surface covered by an epitaxial graphene layer in ultra-high vacuum (UHV). The lattice of the R30° reconstruction was regularly imaged by STM working either in non-oscillating mode or in dynamic mode, which also maps the variations of the force gradient. From these measurements with a constant mean-tunneling-current of 20 pA, it was found that the STM tip suffered variations of the tip/surface force gradient in between 8.25 and 16.50 N/m when it scanned the epitaxial graphene layer on the reconstructed 6H-SiC(0 0 0 1) surface. |
publishDate |
2015 |
dc.date.accessioned.none.fl_str_mv |
2024-05-30T23:13:38Z |
dc.date.available.none.fl_str_mv |
2024-05-30T23:13:38Z |
dc.date.issued.fl_str_mv |
2015 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
dc.identifier.uri.none.fl_str_mv |
https://hdl.handle.net/20.500.12390/657 |
dc.identifier.doi.none.fl_str_mv |
https://doi.org/10.1016/j.carbon.2015.01.050 |
dc.identifier.scopus.none.fl_str_mv |
2-s2.0-84924565690 |
url |
https://hdl.handle.net/20.500.12390/657 https://doi.org/10.1016/j.carbon.2015.01.050 |
identifier_str_mv |
2-s2.0-84924565690 |
dc.language.iso.none.fl_str_mv |
eng |
language |
eng |
dc.relation.ispartof.none.fl_str_mv |
Carbon |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.publisher.none.fl_str_mv |
Elsevier Ltd |
publisher.none.fl_str_mv |
Elsevier Ltd |
dc.source.none.fl_str_mv |
reponame:CONCYTEC-Institucional instname:Consejo Nacional de Ciencia Tecnología e Innovación instacron:CONCYTEC |
instname_str |
Consejo Nacional de Ciencia Tecnología e Innovación |
instacron_str |
CONCYTEC |
institution |
CONCYTEC |
reponame_str |
CONCYTEC-Institucional |
collection |
CONCYTEC-Institucional |
repository.name.fl_str_mv |
Repositorio Institucional CONCYTEC |
repository.mail.fl_str_mv |
repositorio@concytec.gob.pe |
_version_ |
1839175575333240832 |
spelling |
Publicationrp01462600rp01463600rp01460600rp01464600rp01461600rp01465600rp00651500Morán Meza J.A.Lubin C.Thoyer F.Villegas Rosales K.A.Gutarra Espinoza A.A.Martin F.Cousty J.2024-05-30T23:13:38Z2024-05-30T23:13:38Z2015https://hdl.handle.net/20.500.12390/657https://doi.org/10.1016/j.carbon.2015.01.0502-s2.0-84924565690The fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or NaOH solution, using different electronic devices. CF tips with an apex radius ∼10 nm, as deduced from the measured slopes of the Fowler–Nordheim plots (kR < 70 nm for k ∼ 6), were routinely obtained with a homemade electronic device that controls the intensity of the etching current. Then, these conductive CF tips were also characterized by imaging the 6H-SiC(0 0 0 1) surface covered by an epitaxial graphene layer in ultra-high vacuum (UHV). The lattice of the R30° reconstruction was regularly imaged by STM working either in non-oscillating mode or in dynamic mode, which also maps the variations of the force gradient. From these measurements with a constant mean-tunneling-current of 20 pA, it was found that the STM tip suffered variations of the tip/surface force gradient in between 8.25 and 16.50 N/m when it scanned the epitaxial graphene layer on the reconstructed 6H-SiC(0 0 0 1) surface.Consejo Nacional de Ciencia, Tecnología e Innovación Tecnológica - ConcytecengElsevier LtdCarboninfo:eu-repo/semantics/openAccessThermoelectric equipmentAtomic force microscopy-1Carbon-1Carbon fibers-1Frequency modulation-1Graphene-1Silicon carbide-1Dynamic scanning-1Electronic device-1Epitaxial graphene-1Force gradients-1Fowler-Nordheim plots-1https://purl.org/pe-repo/ocde/ford#2.10.00-1Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surfaceinfo:eu-repo/semantics/articlereponame:CONCYTEC-Institucionalinstname:Consejo Nacional de Ciencia Tecnología e Innovacióninstacron:CONCYTEC#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#20.500.12390/657oai:repositorio.concytec.gob.pe:20.500.12390/6572024-06-17 12:15:59.808http://purl.org/coar/access_right/c_14cbinfo:eu-repo/semantics/closedAccessmetadata only accesshttps://repositorio.concytec.gob.peRepositorio Institucional CONCYTECrepositorio@concytec.gob.pe#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#<Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="65bb2a14-1098-4fd8-a060-5b273c9ec62e"> <Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type> <Language>eng</Language> <Title>Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface</Title> <PublishedIn> <Publication> <Title>Carbon</Title> </Publication> </PublishedIn> <PublicationDate>2015</PublicationDate> <DOI>https://doi.org/10.1016/j.carbon.2015.01.050</DOI> <SCP-Number>2-s2.0-84924565690</SCP-Number> <Authors> <Author> <DisplayName>Morán Meza J.A.</DisplayName> <Person id="rp01462" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Lubin C.</DisplayName> <Person id="rp01463" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Thoyer F.</DisplayName> <Person id="rp01460" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Villegas Rosales K.A.</DisplayName> <Person id="rp01464" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Gutarra Espinoza A.A.</DisplayName> <Person id="rp01461" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Martin F.</DisplayName> <Person id="rp01465" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Cousty J.</DisplayName> <Person id="rp00651" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> </Authors> <Editors> </Editors> <Publishers> <Publisher> <DisplayName>Elsevier Ltd</DisplayName> <OrgUnit /> </Publisher> </Publishers> <Keyword>Thermoelectric equipment</Keyword> <Keyword>Atomic force microscopy</Keyword> <Keyword>Carbon</Keyword> <Keyword>Carbon fibers</Keyword> <Keyword>Frequency modulation</Keyword> <Keyword>Graphene</Keyword> <Keyword>Silicon carbide</Keyword> <Keyword>Dynamic scanning</Keyword> <Keyword>Electronic device</Keyword> <Keyword>Epitaxial graphene</Keyword> <Keyword>Force gradients</Keyword> <Keyword>Fowler-Nordheim plots</Keyword> <Abstract>The fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or NaOH solution, using different electronic devices. CF tips with an apex radius ∼10 nm, as deduced from the measured slopes of the Fowler–Nordheim plots (kR < 70 nm for k ∼ 6), were routinely obtained with a homemade electronic device that controls the intensity of the etching current. Then, these conductive CF tips were also characterized by imaging the 6H-SiC(0 0 0 1) surface covered by an epitaxial graphene layer in ultra-high vacuum (UHV). The lattice of the R30° reconstruction was regularly imaged by STM working either in non-oscillating mode or in dynamic mode, which also maps the variations of the force gradient. From these measurements with a constant mean-tunneling-current of 20 pA, it was found that the STM tip suffered variations of the tip/surface force gradient in between 8.25 and 16.50 N/m when it scanned the epitaxial graphene layer on the reconstructed 6H-SiC(0 0 0 1) surface.</Abstract> <Access xmlns="http://purl.org/coar/access_right" > </Access> </Publication> -1 |
score |
13.210282 |
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La información contenida en este registro es de entera responsabilidad de la institución que gestiona el repositorio institucional donde esta contenido este documento o set de datos. El CONCYTEC no se hace responsable por los contenidos (publicaciones y/o datos) accesibles a través del Repositorio Nacional Digital de Ciencia, Tecnología e Innovación de Acceso Abierto (ALICIA).
La información contenida en este registro es de entera responsabilidad de la institución que gestiona el repositorio institucional donde esta contenido este documento o set de datos. El CONCYTEC no se hace responsable por los contenidos (publicaciones y/o datos) accesibles a través del Repositorio Nacional Digital de Ciencia, Tecnología e Innovación de Acceso Abierto (ALICIA).