Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface

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The fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or...

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Detalles Bibliográficos
Autores: Morán Meza J.A., Lubin C., Thoyer F., Villegas Rosales K.A., Gutarra Espinoza A.A., Martin F., Cousty J.
Formato: artículo
Fecha de Publicación:2015
Institución:Consejo Nacional de Ciencia Tecnología e Innovación
Repositorio:CONCYTEC-Institucional
Lenguaje:inglés
OAI Identifier:oai:repositorio.concytec.gob.pe:20.500.12390/657
Enlace del recurso:https://hdl.handle.net/20.500.12390/657
https://doi.org/10.1016/j.carbon.2015.01.050
Nivel de acceso:acceso abierto
Materia:Thermoelectric equipment
Atomic force microscopy
Carbon
Carbon fibers
Frequency modulation
Graphene
Silicon carbide
Dynamic scanning
Electronic device
Epitaxial graphene
Force gradients
Fowler-Nordheim plots
https://purl.org/pe-repo/ocde/ford#2.10.00
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oai_identifier_str oai:repositorio.concytec.gob.pe:20.500.12390/657
network_acronym_str CONC
network_name_str CONCYTEC-Institucional
repository_id_str 4689
dc.title.none.fl_str_mv Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface
title Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface
spellingShingle Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface
Morán Meza J.A.
Thermoelectric equipment
Atomic force microscopy
Carbon
Carbon fibers
Frequency modulation
Graphene
Silicon carbide
Dynamic scanning
Electronic device
Epitaxial graphene
Force gradients
Fowler-Nordheim plots
https://purl.org/pe-repo/ocde/ford#2.10.00
title_short Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface
title_full Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface
title_fullStr Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface
title_full_unstemmed Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface
title_sort Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface
author Morán Meza J.A.
author_facet Morán Meza J.A.
Lubin C.
Thoyer F.
Villegas Rosales K.A.
Gutarra Espinoza A.A.
Martin F.
Cousty J.
author_role author
author2 Lubin C.
Thoyer F.
Villegas Rosales K.A.
Gutarra Espinoza A.A.
Martin F.
Cousty J.
author2_role author
author
author
author
author
author
dc.contributor.author.fl_str_mv Morán Meza J.A.
Lubin C.
Thoyer F.
Villegas Rosales K.A.
Gutarra Espinoza A.A.
Martin F.
Cousty J.
dc.subject.none.fl_str_mv Thermoelectric equipment
topic Thermoelectric equipment
Atomic force microscopy
Carbon
Carbon fibers
Frequency modulation
Graphene
Silicon carbide
Dynamic scanning
Electronic device
Epitaxial graphene
Force gradients
Fowler-Nordheim plots
https://purl.org/pe-repo/ocde/ford#2.10.00
dc.subject.es_PE.fl_str_mv Atomic force microscopy
Carbon
Carbon fibers
Frequency modulation
Graphene
Silicon carbide
Dynamic scanning
Electronic device
Epitaxial graphene
Force gradients
Fowler-Nordheim plots
dc.subject.ocde.none.fl_str_mv https://purl.org/pe-repo/ocde/ford#2.10.00
description The fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or NaOH solution, using different electronic devices. CF tips with an apex radius ∼10 nm, as deduced from the measured slopes of the Fowler–Nordheim plots (kR < 70 nm for k ∼ 6), were routinely obtained with a homemade electronic device that controls the intensity of the etching current. Then, these conductive CF tips were also characterized by imaging the 6H-SiC(0 0 0 1) surface covered by an epitaxial graphene layer in ultra-high vacuum (UHV). The lattice of the R30° reconstruction was regularly imaged by STM working either in non-oscillating mode or in dynamic mode, which also maps the variations of the force gradient. From these measurements with a constant mean-tunneling-current of 20 pA, it was found that the STM tip suffered variations of the tip/surface force gradient in between 8.25 and 16.50 N/m when it scanned the epitaxial graphene layer on the reconstructed 6H-SiC(0 0 0 1) surface.
publishDate 2015
dc.date.accessioned.none.fl_str_mv 2024-05-30T23:13:38Z
dc.date.available.none.fl_str_mv 2024-05-30T23:13:38Z
dc.date.issued.fl_str_mv 2015
dc.type.none.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.uri.none.fl_str_mv https://hdl.handle.net/20.500.12390/657
dc.identifier.doi.none.fl_str_mv https://doi.org/10.1016/j.carbon.2015.01.050
dc.identifier.scopus.none.fl_str_mv 2-s2.0-84924565690
url https://hdl.handle.net/20.500.12390/657
https://doi.org/10.1016/j.carbon.2015.01.050
identifier_str_mv 2-s2.0-84924565690
dc.language.iso.none.fl_str_mv eng
language eng
dc.relation.ispartof.none.fl_str_mv Carbon
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv Elsevier Ltd
publisher.none.fl_str_mv Elsevier Ltd
dc.source.none.fl_str_mv reponame:CONCYTEC-Institucional
instname:Consejo Nacional de Ciencia Tecnología e Innovación
instacron:CONCYTEC
instname_str Consejo Nacional de Ciencia Tecnología e Innovación
instacron_str CONCYTEC
institution CONCYTEC
reponame_str CONCYTEC-Institucional
collection CONCYTEC-Institucional
repository.name.fl_str_mv Repositorio Institucional CONCYTEC
repository.mail.fl_str_mv repositorio@concytec.gob.pe
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spelling Publicationrp01462600rp01463600rp01460600rp01464600rp01461600rp01465600rp00651500Morán Meza J.A.Lubin C.Thoyer F.Villegas Rosales K.A.Gutarra Espinoza A.A.Martin F.Cousty J.2024-05-30T23:13:38Z2024-05-30T23:13:38Z2015https://hdl.handle.net/20.500.12390/657https://doi.org/10.1016/j.carbon.2015.01.0502-s2.0-84924565690The fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or NaOH solution, using different electronic devices. CF tips with an apex radius ∼10 nm, as deduced from the measured slopes of the Fowler–Nordheim plots (kR < 70 nm for k ∼ 6), were routinely obtained with a homemade electronic device that controls the intensity of the etching current. Then, these conductive CF tips were also characterized by imaging the 6H-SiC(0 0 0 1) surface covered by an epitaxial graphene layer in ultra-high vacuum (UHV). The lattice of the R30° reconstruction was regularly imaged by STM working either in non-oscillating mode or in dynamic mode, which also maps the variations of the force gradient. From these measurements with a constant mean-tunneling-current of 20 pA, it was found that the STM tip suffered variations of the tip/surface force gradient in between 8.25 and 16.50 N/m when it scanned the epitaxial graphene layer on the reconstructed 6H-SiC(0 0 0 1) surface.Consejo Nacional de Ciencia, Tecnología e Innovación Tecnológica - ConcytecengElsevier LtdCarboninfo:eu-repo/semantics/openAccessThermoelectric equipmentAtomic force microscopy-1Carbon-1Carbon fibers-1Frequency modulation-1Graphene-1Silicon carbide-1Dynamic scanning-1Electronic device-1Epitaxial graphene-1Force gradients-1Fowler-Nordheim plots-1https://purl.org/pe-repo/ocde/ford#2.10.00-1Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surfaceinfo:eu-repo/semantics/articlereponame:CONCYTEC-Institucionalinstname:Consejo Nacional de Ciencia Tecnología e Innovacióninstacron:CONCYTEC#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#20.500.12390/657oai:repositorio.concytec.gob.pe:20.500.12390/6572024-06-17 12:15:59.808http://purl.org/coar/access_right/c_14cbinfo:eu-repo/semantics/closedAccessmetadata only accesshttps://repositorio.concytec.gob.peRepositorio Institucional CONCYTECrepositorio@concytec.gob.pe#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#<Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="65bb2a14-1098-4fd8-a060-5b273c9ec62e"> <Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type> <Language>eng</Language> <Title>Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface</Title> <PublishedIn> <Publication> <Title>Carbon</Title> </Publication> </PublishedIn> <PublicationDate>2015</PublicationDate> <DOI>https://doi.org/10.1016/j.carbon.2015.01.050</DOI> <SCP-Number>2-s2.0-84924565690</SCP-Number> <Authors> <Author> <DisplayName>Morán Meza J.A.</DisplayName> <Person id="rp01462" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Lubin C.</DisplayName> <Person id="rp01463" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Thoyer F.</DisplayName> <Person id="rp01460" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Villegas Rosales K.A.</DisplayName> <Person id="rp01464" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Gutarra Espinoza A.A.</DisplayName> <Person id="rp01461" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Martin F.</DisplayName> <Person id="rp01465" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Cousty J.</DisplayName> <Person id="rp00651" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> </Authors> <Editors> </Editors> <Publishers> <Publisher> <DisplayName>Elsevier Ltd</DisplayName> <OrgUnit /> </Publisher> </Publishers> <Keyword>Thermoelectric equipment</Keyword> <Keyword>Atomic force microscopy</Keyword> <Keyword>Carbon</Keyword> <Keyword>Carbon fibers</Keyword> <Keyword>Frequency modulation</Keyword> <Keyword>Graphene</Keyword> <Keyword>Silicon carbide</Keyword> <Keyword>Dynamic scanning</Keyword> <Keyword>Electronic device</Keyword> <Keyword>Epitaxial graphene</Keyword> <Keyword>Force gradients</Keyword> <Keyword>Fowler-Nordheim plots</Keyword> <Abstract>The fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or NaOH solution, using different electronic devices. CF tips with an apex radius ∼10 nm, as deduced from the measured slopes of the Fowler–Nordheim plots (kR &lt; 70 nm for k ∼ 6), were routinely obtained with a homemade electronic device that controls the intensity of the etching current. Then, these conductive CF tips were also characterized by imaging the 6H-SiC(0 0 0 1) surface covered by an epitaxial graphene layer in ultra-high vacuum (UHV). The lattice of the R30° reconstruction was regularly imaged by STM working either in non-oscillating mode or in dynamic mode, which also maps the variations of the force gradient. From these measurements with a constant mean-tunneling-current of 20 pA, it was found that the STM tip suffered variations of the tip/surface force gradient in between 8.25 and 16.50 N/m when it scanned the epitaxial graphene layer on the reconstructed 6H-SiC(0 0 0 1) surface.</Abstract> <Access xmlns="http://purl.org/coar/access_right" > </Access> </Publication> -1
score 13.210282
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