Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films

• Autores: Tejada, A, Braunger, S, Korte, L, Albrecht, S, Rech, B, Guerra, JA
• Formato: artículo
• Fecha de Publicación: 2018
• Institución: Consejo Nacional de Ciencia Tecnología e Innovación
• Repositorio: CONCYTEC-Institucional
• Lenguaje: inglés
• OAI Identifier: oai:repositorio.concytec.gob.pe:20.500.12390/986
• Enlace del recurso: https://hdl.handle.net/20.500.12390/986; https://doi.org/10.1063/1.5025728
• Nivel de acceso: acceso abierto
• Materia: spectroscopic; refractive indices; https://purl.org/pe-repo/ocde/ford#1.04.00

The complex refractive indices of formamidinium cesium lead mixed-halide [FA0.83Cs0.17Pb(I1– xBrx)3] perovskite thin films of compositions ranging from x = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable angle spectroscopic ellipsometry and spectral transmittance in the wavelength range of 190 nm to 850 nm. Optical constants, film thicknesses and roughness layers are obtained point-by-point by minimizing a global error function, without using optical dispersion models, and including topographical information supplied by a laser confocal microscope.