Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films

• Autores: Tejada A., Braunger S., Korte L., Albrecht S., Rech B., Guerra J.A.
• Formato: artículo
• Fecha de Publicación: 2018
• Institución: Consejo Nacional de Ciencia Tecnología e Innovación
• Repositorio: CONCYTEC-Institucional
• Lenguaje: inglés
• OAI Identifier: oai:repositorio.concytec.gob.pe:20.500.12390/721
• Enlace del recurso: https://hdl.handle.net/20.500.12390/721; https://doi.org/10.1063/1.5025728
• Nivel de acceso: acceso abierto
• Materia: Thin films; Cesium compounds; Energy gap; Lead compounds; Perovskite; Perovskite solar cells; Refractive index; Spectroscopic ellipsometry; Complex refractive index; Global error function; Laser confocal microscope; Optical characterization; https://purl.org/pe-repo/ocde/ford#1.04.03

The complex refractive indices of formamidinium cesium lead mixed-halide [FA0.83Cs0.17Pb(I1– xBrx)3] perovskite thin films of compositions ranging from x = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable angle spectroscopic ellipsometry and spectral transmittance in the wavelength range of 190 nm to 850 nm.