Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films

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The complex refractive indices of formamidinium cesium lead mixed-halide [FA0.83Cs0.17Pb(I1– xBrx)3] perovskite thin films of compositions ranging from x = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable an...

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Detalles Bibliográficos
Autores: Tejada A., Braunger S., Korte L., Albrecht S., Rech B., Guerra J.A.
Formato: artículo
Fecha de Publicación:2018
Institución:Consejo Nacional de Ciencia Tecnología e Innovación
Repositorio:CONCYTEC-Institucional
Lenguaje:inglés
OAI Identifier:oai:repositorio.concytec.gob.pe:20.500.12390/721
Enlace del recurso:https://hdl.handle.net/20.500.12390/721
https://doi.org/10.1063/1.5025728
Nivel de acceso:acceso abierto
Materia:Thin films
Cesium compounds
Energy gap
Lead compounds
Perovskite
Perovskite solar cells
Refractive index
Spectroscopic ellipsometry
Complex refractive index
Global error function
Laser confocal microscope
Optical characterization
https://purl.org/pe-repo/ocde/ford#1.04.03
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repository_id_str 4689
dc.title.none.fl_str_mv Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films
title Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films
spellingShingle Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films
Tejada A.
Thin films
Cesium compounds
Energy gap
Lead compounds
Perovskite
Perovskite solar cells
Refractive index
Spectroscopic ellipsometry
Complex refractive index
Global error function
Laser confocal microscope
Optical characterization
https://purl.org/pe-repo/ocde/ford#1.04.03
title_short Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films
title_full Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films
title_fullStr Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films
title_full_unstemmed Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films
title_sort Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films
author Tejada A.
author_facet Tejada A.
Braunger S.
Korte L.
Albrecht S.
Rech B.
Guerra J.A.
author_role author
author2 Braunger S.
Korte L.
Albrecht S.
Rech B.
Guerra J.A.
author2_role author
author
author
author
author
dc.contributor.author.fl_str_mv Tejada A.
Braunger S.
Korte L.
Albrecht S.
Rech B.
Guerra J.A.
dc.subject.none.fl_str_mv Thin films
topic Thin films
Cesium compounds
Energy gap
Lead compounds
Perovskite
Perovskite solar cells
Refractive index
Spectroscopic ellipsometry
Complex refractive index
Global error function
Laser confocal microscope
Optical characterization
https://purl.org/pe-repo/ocde/ford#1.04.03
dc.subject.es_PE.fl_str_mv Cesium compounds
Energy gap
Lead compounds
Perovskite
Perovskite solar cells
Refractive index
Spectroscopic ellipsometry
Complex refractive index
Global error function
Laser confocal microscope
Optical characterization
dc.subject.ocde.none.fl_str_mv https://purl.org/pe-repo/ocde/ford#1.04.03
description The complex refractive indices of formamidinium cesium lead mixed-halide [FA0.83Cs0.17Pb(I1– xBrx)3] perovskite thin films of compositions ranging from x = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable angle spectroscopic ellipsometry and spectral transmittance in the wavelength range of 190 nm to 850 nm.
publishDate 2018
dc.date.accessioned.none.fl_str_mv 2024-05-30T23:13:38Z
dc.date.available.none.fl_str_mv 2024-05-30T23:13:38Z
dc.date.issued.fl_str_mv 2018
dc.type.none.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.uri.none.fl_str_mv https://hdl.handle.net/20.500.12390/721
dc.identifier.doi.none.fl_str_mv https://doi.org/10.1063/1.5025728
dc.identifier.scopus.none.fl_str_mv 2-s2.0-85046633107
url https://hdl.handle.net/20.500.12390/721
https://doi.org/10.1063/1.5025728
identifier_str_mv 2-s2.0-85046633107
dc.language.iso.none.fl_str_mv eng
language eng
dc.relation.ispartof.none.fl_str_mv Journal of Applied Physics
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv American Institute of Physics Inc.
publisher.none.fl_str_mv American Institute of Physics Inc.
dc.source.none.fl_str_mv reponame:CONCYTEC-Institucional
instname:Consejo Nacional de Ciencia Tecnología e Innovación
instacron:CONCYTEC
instname_str Consejo Nacional de Ciencia Tecnología e Innovación
instacron_str CONCYTEC
institution CONCYTEC
reponame_str CONCYTEC-Institucional
collection CONCYTEC-Institucional
repository.name.fl_str_mv Repositorio Institucional CONCYTEC
repository.mail.fl_str_mv repositorio@concytec.gob.pe
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spelling Publicationrp01802600rp01799600rp01800600rp01803600rp01801600rp00710500Tejada A.Braunger S.Korte L.Albrecht S.Rech B.Guerra J.A.2024-05-30T23:13:38Z2024-05-30T23:13:38Z2018https://hdl.handle.net/20.500.12390/721https://doi.org/10.1063/1.50257282-s2.0-85046633107The complex refractive indices of formamidinium cesium lead mixed-halide [FA0.83Cs0.17Pb(I1– xBrx)3] perovskite thin films of compositions ranging from x = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable angle spectroscopic ellipsometry and spectral transmittance in the wavelength range of 190 nm to 850 nm.engAmerican Institute of Physics Inc.Journal of Applied Physicsinfo:eu-repo/semantics/openAccessThin filmsCesium compounds-1Energy gap-1Lead compounds-1Perovskite-1Perovskite solar cells-1Refractive index-1Spectroscopic ellipsometry-1Complex refractive index-1Global error function-1Laser confocal microscope-1Optical characterization-1https://purl.org/pe-repo/ocde/ford#1.04.03-1Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin filmsinfo:eu-repo/semantics/articlereponame:CONCYTEC-Institucionalinstname:Consejo Nacional de Ciencia Tecnología e Innovacióninstacron:CONCYTEC#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#20.500.12390/721oai:repositorio.concytec.gob.pe:20.500.12390/7212024-05-30 15:44:31.353http://purl.org/coar/access_right/c_14cbinfo:eu-repo/semantics/closedAccessmetadata only accesshttps://repositorio.concytec.gob.peRepositorio Institucional CONCYTECrepositorio@concytec.gob.pe#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#<Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="44422e59-441a-42fc-846e-97f6582e6e9b"> <Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type> <Language>eng</Language> <Title>Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films</Title> <PublishedIn> <Publication> <Title>Journal of Applied Physics</Title> </Publication> </PublishedIn> <PublicationDate>2018</PublicationDate> <DOI>https://doi.org/10.1063/1.5025728</DOI> <SCP-Number>2-s2.0-85046633107</SCP-Number> <Authors> <Author> <DisplayName>Tejada A.</DisplayName> <Person id="rp01802" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Braunger S.</DisplayName> <Person id="rp01799" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Korte L.</DisplayName> <Person id="rp01800" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Albrecht S.</DisplayName> <Person id="rp01803" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Rech B.</DisplayName> <Person id="rp01801" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Guerra J.A.</DisplayName> <Person id="rp00710" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> </Authors> <Editors> </Editors> <Publishers> <Publisher> <DisplayName>American Institute of Physics Inc.</DisplayName> <OrgUnit /> </Publisher> </Publishers> <Keyword>Thin films</Keyword> <Keyword>Cesium compounds</Keyword> <Keyword>Energy gap</Keyword> <Keyword>Lead compounds</Keyword> <Keyword>Perovskite</Keyword> <Keyword>Perovskite solar cells</Keyword> <Keyword>Refractive index</Keyword> <Keyword>Spectroscopic ellipsometry</Keyword> <Keyword>Complex refractive index</Keyword> <Keyword>Global error function</Keyword> <Keyword>Laser confocal microscope</Keyword> <Keyword>Optical characterization</Keyword> <Abstract>The complex refractive indices of formamidinium cesium lead mixed-halide [FA0.83Cs0.17Pb(I1– xBrx)3] perovskite thin films of compositions ranging from x = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable angle spectroscopic ellipsometry and spectral transmittance in the wavelength range of 190 nm to 850 nm.</Abstract> <Access xmlns="http://purl.org/coar/access_right" > </Access> </Publication> -1
score 13.937125
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