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Experimental determination of refractive indices in semiconducting films: CDS, TI3O5
Publicado por
Rodríguez Laura, Sandro, Miculicich Egoavil, Osar, Oliva Chirinos, Christian, Fiorentini, Arturo, Valera Palacios, Aníbal
Publicado 2001 Enlace
In this work, we present results of measurements of the refraction index realized withsemiconductors in the form of thin films: cadmium sulfide (CdS) and titan oxide (Ti,O). Theapplied method involves: the determination of the Brewster reflection angle, transmission spectra and optical wave guide effect.
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