Texture Quantification in Y Ba 2 Cu 3 O 7 Superconducting Films

• Autores: Gonzalez, J.C., De Los Santos, L, Sánchez Cornejo, H, Osorio, A.M, Albino Aguiar, J., Bustamante, A.
• Formato: artículo
• Fecha de Publicación: 2020
• Institución: Universidad Nacional Mayor de San Marcos
• Repositorio: Revistas - Universidad Nacional Mayor de San Marcos
• Lenguaje: español
• OAI Identifier: oai:ojs.csi.unmsm:article/20293
• Enlace del recurso: https://revistasinvestigacion.unmsm.edu.pe/index.php/fisica/article/view/20293
• Nivel de acceso: acceso abierto
• Materia: Epitaxy; Texture; scanning electronic microscopy; X-ray diffraction; Epitaxia; Textura; Microscopía electrónica de barrido; difracción de rayos X

Y Ba2Cu3O7 epitaxial superconducting film is consequence of an optimum epitaxial growth process of superconducting grains. Also, the substrate's epitaxy has a direct repercussion on the lm microstructure and its physical properties. Conventional characterization techniques such as: scanning electronic microscopy, and x ray difrraction, allowed us to obtain a quick assessment of epitaxy quality through of texture quantification of the film. We present the results of texture quantification in Y Ba2Cu3O7 superconducting films.