Study of analytical methods for extracting electric parameters of thin film photovoltaic modules: Collaboration with the XXIII Peruvian Symposium on Solar Energy

• Autores: Perich Ibañez, Renzo Alberto, Sevillano Bendezú, Miguel Ángel, Montes Romero, Jesús, Conde Mendoza, Luis Ángel, Angulo Abanto, José Rubén, De la Casa Higueras, Juan, Palomino Töfflinger, Jan Amaru
• Formato: artículo
• Fecha de Publicación: 2020
• Institución: Universidad Nacional de Ingeniería
• Repositorio: Revistas - Universidad Nacional de Ingeniería
• Lenguaje: español
• OAI Identifier: oai:oai:revistas.uni.edu.pe:article/851
• Enlace del recurso: https://revistas.uni.edu.pe/index.php/tecnia/article/view/851
• Nivel de acceso: acceso abierto
• Materia: Fotovoltaica; Modelado de tecnologías de lámina delgada; Modelo de un solo diodo; Extracción de parámetros; Curva IV; Photovoltaics; Modelling thin film technologies; Single Diode Model; Parameter extraction; IV curve

In order to find a module’s real efficiency and predict its power and energy production it is necessary to study its behaviour and characterize it in the conditions in which it is installed. The single diode model for photovoltaic (PV) cells relates a cell’s current to its voltage through five electric parameters which give us fundamental information about a module and the physical processes inside its cells. Currently, there are many analytical, numerical and heuristic methods used to extract the model’s parameters, each one with advantages and disadvantages that depend on the technology of the module and climate conditions. Current analytical methods used to extract parameters from silicon modules were applied to thin film PV modules in order to study their validity. This work presents the results of the parameter extraction by comparing the measured current-voltage (IV) curve with the modelled curve, as well as through Normalized Root Mean Square Error (NRMSE) calculations with the objective of comparing and evaluating the selected analytical methods.