Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator
Descripción del Articulo
Accurate characterization of the dielectric properties of solids and, especially, substrates is crucial for circuitry design and development. For applications requiring low cost, wieldy systems, many attempts have been made involving planar resonant microwave devices. However, most of them have a co...
Autores: | , , , |
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Formato: | artículo |
Fecha de Publicación: | 2021 |
Institución: | Consejo Nacional de Ciencia Tecnología e Innovación |
Repositorio: | CONCYTEC-Institucional |
Lenguaje: | inglés |
OAI Identifier: | oai:repositorio.concytec.gob.pe:20.500.12390/2377 |
Enlace del recurso: | https://hdl.handle.net/20.500.12390/2377 https://doi.org/10.1109/LSENS.2021.3055544 |
Nivel de acceso: | acceso abierto |
Materia: | RF characterization cell dielectric permittivity sensor Microwave millimeter wave sensors open-loop resonator (OLR) quality factor resonant frequency http://purl.org/pe-repo/ocde/ford#2.02.02 |
id |
CONC_03f17a5572f0b7f88e381fba7d59e6af |
---|---|
oai_identifier_str |
oai:repositorio.concytec.gob.pe:20.500.12390/2377 |
network_acronym_str |
CONC |
network_name_str |
CONCYTEC-Institucional |
repository_id_str |
4689 |
dc.title.none.fl_str_mv |
Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator |
title |
Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator |
spellingShingle |
Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator Aquino A. RF characterization cell dielectric permittivity sensor Microwave millimeter wave sensors open-loop resonator (OLR) quality factor resonant frequency http://purl.org/pe-repo/ocde/ford#2.02.02 |
title_short |
Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator |
title_full |
Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator |
title_fullStr |
Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator |
title_full_unstemmed |
Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator |
title_sort |
Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator |
author |
Aquino A. |
author_facet |
Aquino A. Juan C.G. Potelon B. Quendo C. |
author_role |
author |
author2 |
Juan C.G. Potelon B. Quendo C. |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Aquino A. Juan C.G. Potelon B. Quendo C. |
dc.subject.none.fl_str_mv |
RF |
topic |
RF characterization cell dielectric permittivity sensor Microwave millimeter wave sensors open-loop resonator (OLR) quality factor resonant frequency http://purl.org/pe-repo/ocde/ford#2.02.02 |
dc.subject.es_PE.fl_str_mv |
characterization cell dielectric permittivity sensor Microwave millimeter wave sensors open-loop resonator (OLR) quality factor resonant frequency |
dc.subject.ocde.none.fl_str_mv |
http://purl.org/pe-repo/ocde/ford#2.02.02 |
description |
Accurate characterization of the dielectric properties of solids and, especially, substrates is crucial for circuitry design and development. For applications requiring low cost, wieldy systems, many attempts have been made involving planar resonant microwave devices. However, most of them have a configuration in which the sample is placed onto the substrate. As a novelty, a structure considering the sample placement into a more sensitive area is presented and analyzed in this letter. The design of this kind of sensors is discussed, and the measurement results are presented. The proposed device is shown to be capable of measuring the full complex permittivity of the sample, and the results compare well with other previous attempts. © 2017 IEEE. |
publishDate |
2021 |
dc.date.accessioned.none.fl_str_mv |
2024-05-30T23:13:38Z |
dc.date.available.none.fl_str_mv |
2024-05-30T23:13:38Z |
dc.date.issued.fl_str_mv |
2021 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
dc.identifier.uri.none.fl_str_mv |
https://hdl.handle.net/20.500.12390/2377 |
dc.identifier.doi.none.fl_str_mv |
https://doi.org/10.1109/LSENS.2021.3055544 |
dc.identifier.scopus.none.fl_str_mv |
2-s2.0-85100465292 |
url |
https://hdl.handle.net/20.500.12390/2377 https://doi.org/10.1109/LSENS.2021.3055544 |
identifier_str_mv |
2-s2.0-85100465292 |
dc.language.iso.none.fl_str_mv |
eng |
language |
eng |
dc.relation.ispartof.none.fl_str_mv |
IEEE Sensors Letters |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.publisher.none.fl_str_mv |
Institute of Electrical and Electronics Engineers Inc. |
publisher.none.fl_str_mv |
Institute of Electrical and Electronics Engineers Inc. |
dc.source.none.fl_str_mv |
reponame:CONCYTEC-Institucional instname:Consejo Nacional de Ciencia Tecnología e Innovación instacron:CONCYTEC |
instname_str |
Consejo Nacional de Ciencia Tecnología e Innovación |
instacron_str |
CONCYTEC |
institution |
CONCYTEC |
reponame_str |
CONCYTEC-Institucional |
collection |
CONCYTEC-Institucional |
repository.name.fl_str_mv |
Repositorio Institucional CONCYTEC |
repository.mail.fl_str_mv |
repositorio@concytec.gob.pe |
_version_ |
1844883051885101056 |
spelling |
Publicationrp05778600rp05779600rp05777600rp05780600Aquino A.Juan C.G.Potelon B.Quendo C.2024-05-30T23:13:38Z2024-05-30T23:13:38Z2021https://hdl.handle.net/20.500.12390/2377https://doi.org/10.1109/LSENS.2021.30555442-s2.0-85100465292Accurate characterization of the dielectric properties of solids and, especially, substrates is crucial for circuitry design and development. For applications requiring low cost, wieldy systems, many attempts have been made involving planar resonant microwave devices. However, most of them have a configuration in which the sample is placed onto the substrate. As a novelty, a structure considering the sample placement into a more sensitive area is presented and analyzed in this letter. The design of this kind of sensors is discussed, and the measurement results are presented. The proposed device is shown to be capable of measuring the full complex permittivity of the sample, and the results compare well with other previous attempts. © 2017 IEEE.Consejo Nacional de Ciencia, Tecnología e Innovación Tecnológica - ConcytecengInstitute of Electrical and Electronics Engineers Inc.IEEE Sensors Lettersinfo:eu-repo/semantics/openAccessRFcharacterization cell-1dielectric permittivity sensor-1Microwave millimeter wave sensors-1open-loop resonator (OLR)-1quality factor-1resonant frequency-1http://purl.org/pe-repo/ocde/ford#2.02.02-1Dielectric Permittivity Sensor Based on Planar Open-Loop Resonatorinfo:eu-repo/semantics/articlereponame:CONCYTEC-Institucionalinstname:Consejo Nacional de Ciencia Tecnología e Innovacióninstacron:CONCYTEC#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#20.500.12390/2377oai:repositorio.concytec.gob.pe:20.500.12390/23772024-05-30 15:45:34.027http://purl.org/coar/access_right/c_14cbinfo:eu-repo/semantics/closedAccessmetadata only accesshttps://repositorio.concytec.gob.peRepositorio Institucional CONCYTECrepositorio@concytec.gob.pe#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#<Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="06dbd9a9-5d67-4c9a-a4ff-5f7813b8324b"> <Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type> <Language>eng</Language> <Title>Dielectric Permittivity Sensor Based on Planar Open-Loop Resonator</Title> <PublishedIn> <Publication> <Title>IEEE Sensors Letters</Title> </Publication> </PublishedIn> <PublicationDate>2021</PublicationDate> <DOI>https://doi.org/10.1109/LSENS.2021.3055544</DOI> <SCP-Number>2-s2.0-85100465292</SCP-Number> <Authors> <Author> <DisplayName>Aquino A.</DisplayName> <Person id="rp05778" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Juan C.G.</DisplayName> <Person id="rp05779" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Potelon B.</DisplayName> <Person id="rp05777" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Quendo C.</DisplayName> <Person id="rp05780" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> </Authors> <Editors> </Editors> <Publishers> <Publisher> <DisplayName>Institute of Electrical and Electronics Engineers Inc.</DisplayName> <OrgUnit /> </Publisher> </Publishers> <Keyword>RF</Keyword> <Keyword>characterization cell</Keyword> <Keyword>dielectric permittivity sensor</Keyword> <Keyword>Microwave millimeter wave sensors</Keyword> <Keyword>open-loop resonator (OLR)</Keyword> <Keyword>quality factor</Keyword> <Keyword>resonant frequency</Keyword> <Abstract>Accurate characterization of the dielectric properties of solids and, especially, substrates is crucial for circuitry design and development. For applications requiring low cost, wieldy systems, many attempts have been made involving planar resonant microwave devices. However, most of them have a configuration in which the sample is placed onto the substrate. As a novelty, a structure considering the sample placement into a more sensitive area is presented and analyzed in this letter. The design of this kind of sensors is discussed, and the measurement results are presented. The proposed device is shown to be capable of measuring the full complex permittivity of the sample, and the results compare well with other previous attempts. © 2017 IEEE.</Abstract> <Access xmlns="http://purl.org/coar/access_right" > </Access> </Publication> -1 |
score |
13.243185 |
Nota importante:
La información contenida en este registro es de entera responsabilidad de la institución que gestiona el repositorio institucional donde esta contenido este documento o set de datos. El CONCYTEC no se hace responsable por los contenidos (publicaciones y/o datos) accesibles a través del Repositorio Nacional Digital de Ciencia, Tecnología e Innovación de Acceso Abierto (ALICIA).
La información contenida en este registro es de entera responsabilidad de la institución que gestiona el repositorio institucional donde esta contenido este documento o set de datos. El CONCYTEC no se hace responsable por los contenidos (publicaciones y/o datos) accesibles a través del Repositorio Nacional Digital de Ciencia, Tecnología e Innovación de Acceso Abierto (ALICIA).