Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films

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The complex refractive indices of formamidinium cesium lead mixed-halide [FA0.83Cs0.17Pb(I1– xBrx)3] perovskite thin films of compositions ranging from x = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable an...

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Detalles Bibliográficos
Autores: Tejada, A, Braunger, S, Korte, L, Albrecht, S, Rech, B, Guerra, JA
Formato: artículo
Fecha de Publicación:2018
Institución:Consejo Nacional de Ciencia Tecnología e Innovación
Repositorio:CONCYTEC-Institucional
Lenguaje:inglés
OAI Identifier:oai:repositorio.concytec.gob.pe:20.500.12390/986
Enlace del recurso:https://hdl.handle.net/20.500.12390/986
https://doi.org/10.1063/1.5025728
Nivel de acceso:acceso abierto
Materia:spectroscopic
refractive indices
https://purl.org/pe-repo/ocde/ford#1.04.00
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oai_identifier_str oai:repositorio.concytec.gob.pe:20.500.12390/986
network_acronym_str CONC
network_name_str CONCYTEC-Institucional
repository_id_str 4689
dc.title.none.fl_str_mv Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films
title Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films
spellingShingle Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films
Tejada, A
spectroscopic
refractive indices
refractive indices
https://purl.org/pe-repo/ocde/ford#1.04.00
title_short Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films
title_full Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films
title_fullStr Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films
title_full_unstemmed Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films
title_sort Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films
author Tejada, A
author_facet Tejada, A
Braunger, S
Korte, L
Albrecht, S
Rech, B
Guerra, JA
author_role author
author2 Braunger, S
Korte, L
Albrecht, S
Rech, B
Guerra, JA
author2_role author
author
author
author
author
dc.contributor.author.fl_str_mv Tejada, A
Braunger, S
Korte, L
Albrecht, S
Rech, B
Guerra, JA
dc.subject.none.fl_str_mv spectroscopic
topic spectroscopic
refractive indices
refractive indices
https://purl.org/pe-repo/ocde/ford#1.04.00
dc.subject.es_PE.fl_str_mv refractive indices
refractive indices
dc.subject.ocde.none.fl_str_mv https://purl.org/pe-repo/ocde/ford#1.04.00
description The complex refractive indices of formamidinium cesium lead mixed-halide [FA0.83Cs0.17Pb(I1– xBrx)3] perovskite thin films of compositions ranging from x = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable angle spectroscopic ellipsometry and spectral transmittance in the wavelength range of 190 nm to 850 nm. Optical constants, film thicknesses and roughness layers are obtained point-by-point by minimizing a global error function, without using optical dispersion models, and including topographical information supplied by a laser confocal microscope.
publishDate 2018
dc.date.accessioned.none.fl_str_mv 2024-05-30T23:13:38Z
dc.date.available.none.fl_str_mv 2024-05-30T23:13:38Z
dc.date.issued.fl_str_mv 2018
dc.type.none.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.uri.none.fl_str_mv https://hdl.handle.net/20.500.12390/986
dc.identifier.doi.none.fl_str_mv https://doi.org/10.1063/1.5025728
dc.identifier.isi.none.fl_str_mv 414357800012
url https://hdl.handle.net/20.500.12390/986
https://doi.org/10.1063/1.5025728
identifier_str_mv 414357800012
dc.language.iso.none.fl_str_mv eng
language eng
dc.relation.ispartof.none.fl_str_mv Journal of Applied Physics
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
dc.rights.uri.none.fl_str_mv https://creativecommons.org/licenses/by/4.0/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by/4.0/
dc.publisher.none.fl_str_mv AIP Publishing LLC.
publisher.none.fl_str_mv AIP Publishing LLC.
dc.source.none.fl_str_mv reponame:CONCYTEC-Institucional
instname:Consejo Nacional de Ciencia Tecnología e Innovación
instacron:CONCYTEC
instname_str Consejo Nacional de Ciencia Tecnología e Innovación
instacron_str CONCYTEC
institution CONCYTEC
reponame_str CONCYTEC-Institucional
collection CONCYTEC-Institucional
repository.name.fl_str_mv Repositorio Institucional CONCYTEC
repository.mail.fl_str_mv repositorio@concytec.gob.pe
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spelling Publicationrp01802500rp01799500rp01800500rp01803400rp01801500rp00710500Tejada, ABraunger, SKorte, LAlbrecht, SRech, BGuerra, JA2024-05-30T23:13:38Z2024-05-30T23:13:38Z2018https://hdl.handle.net/20.500.12390/986https://doi.org/10.1063/1.5025728414357800012The complex refractive indices of formamidinium cesium lead mixed-halide [FA0.83Cs0.17Pb(I1– xBrx)3] perovskite thin films of compositions ranging from x = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable angle spectroscopic ellipsometry and spectral transmittance in the wavelength range of 190 nm to 850 nm. Optical constants, film thicknesses and roughness layers are obtained point-by-point by minimizing a global error function, without using optical dispersion models, and including topographical information supplied by a laser confocal microscope.Consejo Nacional de Ciencia, Tecnología e Innovación Tecnológica - ConcytecengAIP Publishing LLC.Journal of Applied Physicsinfo:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by/4.0/spectroscopicrefractive indices-1refractive indices-1https://purl.org/pe-repo/ocde/ford#1.04.00-1Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin filmsinfo:eu-repo/semantics/articlereponame:CONCYTEC-Institucionalinstname:Consejo Nacional de Ciencia Tecnología e Innovacióninstacron:CONCYTEC#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#20.500.12390/986oai:repositorio.concytec.gob.pe:20.500.12390/9862024-05-30 15:44:08.543https://creativecommons.org/licenses/by/4.0/info:eu-repo/semantics/openAccesshttp://purl.org/coar/access_right/c_14cbinfo:eu-repo/semantics/closedAccessmetadata only accesshttps://repositorio.concytec.gob.peRepositorio Institucional CONCYTECrepositorio@concytec.gob.pe#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#<Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="164a1112-76ca-4630-85f3-7687170addd1"> <Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type> <Language>eng</Language> <Title>Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films</Title> <PublishedIn> <Publication> <Title>Journal of Applied Physics</Title> </Publication> </PublishedIn> <PublicationDate>2018</PublicationDate> <DOI>https://doi.org/10.1063/1.5025728</DOI> <ISI-Number>414357800012</ISI-Number> <Authors> <Author> <DisplayName>Tejada, A</DisplayName> <Person id="rp01802" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Braunger, S</DisplayName> <Person id="rp01799" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Korte, L</DisplayName> <Person id="rp01800" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Albrecht, S</DisplayName> <Person id="rp01803" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Rech, B</DisplayName> <Person id="rp01801" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> <Author> <DisplayName>Guerra, JA</DisplayName> <Person id="rp00710" /> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> </Authors> <Editors> </Editors> <Publishers> <Publisher> <DisplayName>AIP Publishing LLC.</DisplayName> <OrgUnit /> </Publisher> </Publishers> <License>https://creativecommons.org/licenses/by/4.0/</License> <Keyword>spectroscopic</Keyword> <Keyword>refractive indices</Keyword> <Keyword>refractive indices</Keyword> <Abstract>The complex refractive indices of formamidinium cesium lead mixed-halide [FA0.83Cs0.17Pb(I1– xBrx)3] perovskite thin films of compositions ranging from x = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable angle spectroscopic ellipsometry and spectral transmittance in the wavelength range of 190 nm to 850 nm. Optical constants, film thicknesses and roughness layers are obtained point-by-point by minimizing a global error function, without using optical dispersion models, and including topographical information supplied by a laser confocal microscope.</Abstract> <Access xmlns="http://purl.org/coar/access_right" > </Access> </Publication> -1
score 13.304014
Optical characterization and bandgap engineering of flat and wrinkle-textured FA(0.83)Cs(0.17)Pb(l(1-x)Brx)(3) perovskite thin films
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