Cita APA

Sevillano Bendezú, M. Á. (2019). Comparison and evaluation of measured and simulated high-frequency capacitance-voltage curves of MOS structures for different interface passivation parameters.

Citación estilo Chicago

Sevillano Bendezú, Miguel Ángel. Comparison and Evaluation of Measured and Simulated High-frequency Capacitance-voltage Curves of MOS Structures for Different Interface Passivation Parameters. 2019.

Cita MLA

Sevillano Bendezú, Miguel Ángel. Comparison and Evaluation of Measured and Simulated High-frequency Capacitance-voltage Curves of MOS Structures for Different Interface Passivation Parameters. 2019.